DocumentCode :
283053
Title :
Strong scatters and 1-D Born inversion
Author :
Bond, L.J. ; Zhang, H.
Author_Institution :
Dept. of Mech. Eng., Univ. Coll. London, UK
fYear :
1988
fDate :
32204
Firstpage :
42522
Lastpage :
42525
Abstract :
The 1-D born Inversion technique is well established as a method which gives defect radii from pulse-echo ultrasonic measurements. Recent developments have provided a robust sizing technique for weak scatterers that gives the diameter of a flaw from measurements in the Born Radius/Zero-of-Time Shift Domain (BR/ZOTSD) without the explicit need to select a correct zero-of-time for the inversion. The paper reports some aspects of the extension of this work to consider the sizing of strong scatterers such as spherical voids and inclusions
Keywords :
flaw detection; ultrasonic materials testing; 1-D Born inversion; Born Radius/Zero-of-Time Shift Domain; defect radii; flaw detection; inclusions; pulse-echo ultrasonic measurements; sizing technique; spherical voids; strong scatterers;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Digital Signal Processing and Display Techniques for Ultrasonics, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
208873
Link To Document :
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