DocumentCode :
2831135
Title :
Selection of the state variables for partial enhanced scan techniques
Author :
Matrosova, A. ; Melnikov, A. ; Mukhamedov, R. ; Singh, V.
Author_Institution :
Tomsk State Univ., Tomsk, Russia
fYear :
2011
fDate :
9-12 Sept. 2011
Firstpage :
285
Lastpage :
290
Abstract :
Structural scan based delay testing is used to detect delay faults. Because of the architectural limitations not each test pair v1, v2 can be applied by scan delay testing. That declines test coverage. Partial enhanced scan approach based on selection of flip-flops was suggested to permit using arbitrary test pairs v1, v2. The problem of selection of flip-flops may be solved with applying estimations of controllability and observability of the state variables corresponding to the flip-flops. Calculation of controllability and observability estimations is based on 2-length combinational equivalent analyses and PDF testing.
Keywords :
combinational circuits; controllability; delay circuits; flip-flops; logic testing; observability; 2-length combinational equivalent analysis; PDF testing; delay fault detection; flip-flop; observability estimation; partial enhanced scan technique; state variables observability; structural scan based delay testing; Boolean functions; Controllability; Data structures; Flip-flops; Probability; Probability density function; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium (EWDTS), 2011 9th East-West
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-1957-8
Type :
conf
DOI :
10.1109/EWDTS.2011.6116413
Filename :
6116413
Link To Document :
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