• DocumentCode
    2831240
  • Title

    Using Security and Dependability Patterns for Reaction Processes

  • Author

    Giacomo, V. Di ; Felici, M. ; Meduri, V. ; Presenza, D. ; Riccucci, C. ; Tedeschi, A.

  • Author_Institution
    R&D Laborator, Eng. Ing. Inf. S.p.A., Rome
  • fYear
    2008
  • fDate
    1-5 Sept. 2008
  • Firstpage
    315
  • Lastpage
    319
  • Abstract
    Security and dependability (S&D) patterns support the structuring and reusing of design solutions to specific known problems. They capture S&D features and support reusing strategies across ´similar´ design problems. Despite the fact that they simplify the analysis and implementation of specific design problems concerning with S&D features, the empirical results about S&D patterns and their usages are still patchy. Moreover, there is yet little experience in reporting how S&D patterns transfer across different industry domains. This paper is concerned with the adoption of S&D patterns. It reports our experience in adopting and eliciting S&D patterns in the air traffic management (ATM) domain. Empirical results show how patters provide useful guidance in order to structure the analysis of operational aspects. This paper highlights how S&D patterns, used at the design stage, provide structuring guidance at the operational stage. Hence, they are also useful as structured reaction mechanisms to threats or hazards. In conclusions, this paper provides useful insights about adopting and deploying S&D patterns into and across industry domains.
  • Keywords
    air traffic control; security; S&D patterns; air traffic management; dependability patterns; security patterns; structured reaction mechanisms; Ambient intelligence; Computerized monitoring; Data engineering; Data security; Databases; Expert systems; Hazards; Laboratories; Pattern analysis; Research and development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Database and Expert Systems Application, 2008. DEXA '08. 19th International Workshop on
  • Conference_Location
    Turin
  • ISSN
    1529-4188
  • Print_ISBN
    978-0-7695-3299-8
  • Type

    conf

  • DOI
    10.1109/DEXA.2008.102
  • Filename
    4624735