• DocumentCode
    2831521
  • Title

    Seebeck coefficient and resistivity measurement of polycrystalline Bi in a magnetic field

  • Author

    Ishikawa, Yoshiaki ; Suzuki, Atsushi ; Komine, Takashi ; Shirai, Hajime ; Hasegawa, Yasubiro

  • Author_Institution
    Graduate Sch. of Sci. & Eng., Saitama Univ., Japan
  • fYear
    2003
  • fDate
    17-21 Aug. 2003
  • Firstpage
    286
  • Lastpage
    289
  • Abstract
    Seebeck coefficient and resistivity of a polycrystalline Bi sample were measured from 15 to 300 K in a magnetic field. The measured Seebeck coefficient at 15 K was -10 μV/K at 0 Tesla; however, the Seebeck coefficient enormously varied as a function of magnetic field and was over -1 mV/K at 1.5 Tesla. The Hall coefficient was measured by Van der Pauw method in order to evaluate the carrier density for estimating the mechanism of varying Seebeck coefficient at 15 K, and the carrier density decreased by a factor of 1/30 at 1.5 Tesla. It was shown that one reason for the variation of the Seebeck coefficient was the influence of phonon drag effect, even for polycrystalline Bi. A large Seebeck coefficient was observed below the Debye temperature of Bi in the magnetic field, The resistivity at 15 K also enormously increased in the transverse magnetic field due to the decreased carrier density, and the ratio of the increase of the resistivity compared to the case for no magnetic field was approximately 1000 times at 1.5 Tesla and decreased with increasing temperature. The increase in the resistivity influenced the phonon drag effect and increased the Seebeck coefficient.
  • Keywords
    Debye temperature; Hall effect; Seebeck effect; bismuth; carrier density; thermoelectricity; 1.5 T; 15 to 300 K; Bi; Hall coefficient; Seebeck coefficient; Van der Pauw method; carrier density; phonon drag effect; polycrystalline Bi; resistivity; Acoustic scattering; Bismuth; Charge carrier density; Conductivity measurement; Drag; Magnetic field measurement; Magnetic fields; Phonons; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
  • Print_ISBN
    0-7803-8301-X
  • Type

    conf

  • DOI
    10.1109/ICT.2003.1287505
  • Filename
    1287505