Title :
A compact, fugh repetition-rate trigger generator
Author :
Bemhardt, E.T. ; Chu, E.Y. ; Ness, R.M.
Author_Institution :
Maxwell Laboratories, Inc.
Keywords :
Circuit testing; Insulated gate bipolar transistors; MOSFETs; Power transistors; Pulse circuits; Pulse compression methods; Pulse generation; Pulse transformers; Solid state circuits; Voltage;
Conference_Titel :
Pulsed Power Conference, 1989. 7th
DOI :
10.1109/PPC.1989.767479
