DocumentCode :
2831927
Title :
Development of thermoelectric detectors on the basis of higher manganese silicide (HMS) films
Author :
Kamilov, T.S. ; Uzokov, A.A. ; Kabilov, D.K. ; Ordin, S.V. ; Klechkovskaya, V.V. ; Zanaveskina, I.S. ; Muminov, R.A. ; Zaveryukhin, B.N.
Author_Institution :
Tashkent State Aviation Inst., Uzbekistan
fYear :
2003
fDate :
17-21 Aug. 2003
Firstpage :
384
Lastpage :
387
Abstract :
It is known that HMS - MnSi1.71-1.75 is an anisotropy degenerative semiconductor and has figure-of-merit Z=0.7x10-3 K-1 in the range T=400-1000K. It is used in production of high effective thermoelectric converters. Besides, HMS has high chemical and radioactive resistance. At first in the world practice, we developed and created the technology of production of poly crystalline MnSi1.71-1.75 thin films on the silicon substrates. These MnSi1.71-1.75 films have better thermoelectric and photoelectric parameters than MnSi1.71-1.75 bulk single crystals. We also created the thermoelectric converters and the detectors of infrared radiation on basic MnSi1.71-1.75 films with thickness d=1-20 μm. The phase and structural analyses of MnSi1.71-1.75 films were carried out by X-ray reflection, electron diffraction and transmission electron microscopy methods. The analyses demonstrated that the MnSi1.71-1.75 films have a polycrystalline columnar structure of crystallites the grown crystallites had the normal orientation with respect to the Si-substrate. The main parameters of the HMS thermoelectric converters and HMS IR-detectors were studied at T=400-1000 K. These devices are stable and have the sensitivity S=500-1000 μV/W the thermoelectric power α=150-250 μV/K and the response time τ≤10-6 s at T=223- 1000 K. It is notified that the technology of production of MnSi1.71-1.75- films and MnSi1.71-1,75device is cheap and ecologically clean. Moreover, the devices were processed by ultrasonic at frequency f=3.5 MHz with intensity 1 W/cm2 for 45 minutes at T=300 K. As a result, the thermo electromotive force has been increased significantly from the above range to α=360 - 400 μV/K.
Keywords :
electron diffraction; infrared detectors; manganese compounds; semiconductor thin films; thermoelectric conversion; thermoelectric devices; thermoelectric power; transmission electron microscopy; 223 to 1000 K; 3.5 MHz; 300 K; 400 to 1000 K; MnSi1.71; MnSi1.75; X-ray reflection; anisotropy degenerative semiconductor; electron diffraction; figure-of-merit; high effective thermoelectric converters; higher manganese silicide films; infrared radiation; photoelectric parameters; polycrystalline columnar structure; response time; thermo electromotive force; thermoelectric converters; thermoelectric detectors; thermoelectric parameters; thermoelectric power; transmission electron microscopy; Crystallization; Electrons; Infrared detectors; Manganese; Optical films; Production; Semiconductor films; Silicides; Thermoelectric devices; Thermoelectricity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN :
0-7803-8301-X
Type :
conf
DOI :
10.1109/ICT.2003.1287528
Filename :
1287528
Link To Document :
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