Title :
IEE Colloquium on `Large Signal Device Models and Parameter Extractions for Circuit Simulation´ (Digest No.56)
Abstract :
The following topics were dealt with: MOSFETs; MESFETs; software; bipolar transistors; SPICE; nonlinear models. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords :
circuit CAD; digital simulation; semiconductor device models;
Conference_Titel :
Large Signal Device Models and Parameter Extractions for Circuit Simulation, IEE Colloquium on
Conference_Location :
London
