DocumentCode :
283199
Title :
ASICS. Can your designs be tested?
Author :
Boyce, A.H.
Author_Institution :
MSDS Res. Lab., Marconi Res. Centre, Chelmsford, UK
fYear :
1988
fDate :
32252
Firstpage :
42461
Lastpage :
42463
Abstract :
With the combination of surface-mount inter-connection technology and the ever increasing integrated circuit complexity of ASICs the problems of testing VLSI devices and PCBs must not be ignored. It has been said that 90% of the cost of digital devices could be due to testing. With a reduction of testing costs one will have a great advantages over the other manufacturers. There is no easy answer but it is always possible to design untestable circuits. A designer has to appreciate that he is responsible for the testing costs as well as the design costs. When a design is produced that can readily be tested then there is a much better chance that this product will be reliable and therefore easier to manufacture
Keywords :
VLSI; digital integrated circuits; integrated circuit testing; ASICS; PCBs; VLSI; digital devices; integrated circuit complexity; surface-mount inter-connection technology; testing; testing costs; untestable circuits;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Managing ASIC Design Projects, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
209099
Link To Document :
بازگشت