• DocumentCode
    2832033
  • Title

    Learning lazy naive Bayesian classifiers for ranking

  • Author

    Jiang, Liangxiao ; Guo, Yuanyuan

  • Author_Institution
    Fac. of Comput. Sci., China Univ. of Geosciences, Hubei
  • fYear
    2005
  • fDate
    16-16 Nov. 2005
  • Lastpage
    416
  • Abstract
    Naive Bayes (simply NB) has been well-known as an effective and efficient classification algorithm. However, it is based on the conditional independence assumption that it is often violated in applications. In addition, in many real-world data mining applications, however, an accurate ranking of instances is often required rather than an accurate classification. For example, a ranking of customers in terms of the likelihood that they buy one´s products is useful in direct marketing. In this paper, we firstly investigate the ranking performance of some lazy learning algorithms for extending naive Bayes. The ranking performance is measured by Hand and Till (2001) and Bradley (1997). We observe that they can not significantly improve naive Bayes´ ranking performance. Motivated by this fact and aiming at improving naive Bayes with accurate ranking, we present a new lazy learning algorithm, called lazy naive Bayes (simply LNB), to extend naive Bayes for ranking. We experimentally tested our algorithm, using the whole 36 UCI data sets (Blake and Merz, 2000) recommended by Weka, and compared it to NB and C4.4 (Provost and Domingos, 2003) measured by AUC. The experimental results show that our algorithm significantly outperforms both NB and C4.4
  • Keywords
    Bayes methods; learning (artificial intelligence); pattern classification; classification algorithm; lazy learning algorithm; lazy naive Bayesian classifier learning; naive Bayes method; Application software; Bayesian methods; Classification algorithms; Computer science; Data mining; Equations; Error analysis; Geology; Niobium; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Tools with Artificial Intelligence, 2005. ICTAI 05. 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1082-3409
  • Print_ISBN
    0-7695-2488-5
  • Type

    conf

  • DOI
    10.1109/ICTAI.2005.80
  • Filename
    1562971