Title :
1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference
Abstract :
The following topics were dealt with: microelectronic devices and circuits; test facilities; bipolar linear devices and circuits; total dose and dose rate effects; single event effects; power MOSFETs; NASA spacecraft electronics
Keywords :
radiation effects; microelectronic circuits; radiation effects; single event effects; spacecraft electronics; test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location :
Indian Wells, CA, USA
Print_ISBN :
0-7803-3398-5
DOI :
10.1109/REDW.1996.574180
