Title :
Life tests of a skutterudites thermoelectric unicouple (MAR-03)
Author :
Ei-Genk, M.S. ; Saber, Hamed H. ; Sakamoto, Jeff ; Caillat, Thierry
Author_Institution :
Dept. of Chem. & Nucl. Eng., New Mexico Univ., Albuquerque, NM, USA
Abstract :
Life tests of a skutterudites unicouple (MAR-03) comprised of CeFe3.5Co0.5Sb12 P-leg and CoSb3 N-leg are performed. The tests, which are performed in argon at 0.051-0.068 MPa to suppress the antimony (Sb) sublimation from the N- and P-legs near the hot shoe, lasted for 450 hours, of which 261 hours at constant hot and cold junction temperatures of 973 K and 300 K, respectively. The open-circuit voltage, Voc (or Seebeck coefficient), and peak electric power, Pe,peak, decreased linearly from 203.6 mV and 671 mWe to 183.9 mV and 502 mWe, respectively, in 261 hours of cumulative testing. While the peak efficiency, ηpeak based on the measured voltage-current (V-I) characteristics and assuming zero side heat losses also decreased linearly from 10.3% after 24 hrs to 9.35% after 259 hrs of commutative testing. The estimated actual efficiency is lower, 7.32% and 3.83%, respectively, due to side heat losses. Ongoing tests confirmed present results and showed that the decrease in Seebeck coefficient of P-Leg levels off after 460-500 hours of testing, while that of the N-leg experiences little change. Post-tests examination showed only minimal losses of Sb from the N- and P-legs.
Keywords :
Seebeck effect; cerium compounds; cobalt compounds; contact resistance; iron compounds; thermocouples; thermoelectric conversion; thermoelectricity; 183.9 mV; 203.6 mV; 261 h; 300 K; 450 h; 973 K; CeFe3.5Co0.5Sb12; CoSb3; Seebeck coefficient; commutative testing; estimated actual efficiency; life tests; peak efficiency; peak electric power; skutterudites thermoelectric unicouple; Argon; Circuit testing; Footwear; Life testing; Performance evaluation; Propulsion; Space technology; Tellurium; Temperature; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN :
0-7803-8301-X
DOI :
10.1109/ICT.2003.1287537