Exact noise analysis of ´ideal´ SC networks

An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated