Title :
Total ionizing dose (TID) evaluation results of low dose rate testing for NASA programs
Author :
Sharma, Ashok K. ; Sahu, Kusum ; Brashears, Sidney
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
Low dose rate radiation testing in the range of 0.01-0.20 rads(Si)/s has been performed at Goddard Space Flight Center on a wide variety of non-RH (rad-hard) part types in the last few years. This paper reports on recent test results of EEPROMs, Operational Amplifiers, Analog-to-Digital Converters (ADCs) and Digital-to-Analog Converters (DACs), and DC-DC converters. These results have shown that non-RH parts are suitable for many low earth orbiting satellites, where predicted mission total dose requirements may be in the range of 0.5-10 krads(Si). However, a careful characterization of non-RH parts should be performed to verify that the parts meet the requirements of their intended application in the projected mission radiation environment
Keywords :
DC-DC power convertors; EPROM; analogue-digital conversion; circuit testing; digital-analogue conversion; gamma-ray effects; operational amplifiers; space vehicle electronics; 0.5 to 10 krad; DC-DC converter; EEPROM; NASA program; analog-to-digital converter; digital-to-analog converter; low dose rate radiation testing; low earth orbiting satellite; nonRH part; operational amplifier; total ionizing dose; Analog-digital conversion; Annealing; DC-DC power converters; EPROM; Low earth orbit satellites; NASA; Operational amplifiers; Performance evaluation; Semiconductor device packaging; Semiconductor device testing;
Conference_Titel :
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location :
Indian Wells, CA
Print_ISBN :
0-7803-3398-5
DOI :
10.1109/REDW.1996.574183
