Title :
Current single event effect test results for candidate spacecraft electronics
Author :
LaBel, Kenneth A. ; Moran, Amy K. ; Hawkins, Donald K. ; Sanders, Anthony B. ; Seidleck, Christina M. ; Kim, Hak S. ; Forney, James E. ; Stassinopoulos, E.G. ; Marshall, Paul ; Dale, Cheryl ; Kinnison, James ; Carkhuff, Bliss
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC converters
Keywords :
CMOS integrated circuits; DC-DC power convertors; DRAM chips; EPROM; analogue integrated circuits; digital integrated circuits; ion beam effects; proton effects; space vehicle electronics; DC-DC converters; DRAM; EEPROM; analog devices; digital devices; heavy ion effects; proton effects; single event effect test results; spacecraft electronics; Aerospace electronics; Electronic equipment testing; Laboratories; Performance evaluation; Physics; Protons; Single event upset; Space vehicles; Test facilities; User centered design;
Conference_Titel :
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location :
Indian Wells, CA
Print_ISBN :
0-7803-3398-5
DOI :
10.1109/REDW.1996.574184
