• DocumentCode
    2832426
  • Title

    Current single event effect test results for candidate spacecraft electronics

  • Author

    LaBel, Kenneth A. ; Moran, Amy K. ; Hawkins, Donald K. ; Sanders, Anthony B. ; Seidleck, Christina M. ; Kim, Hak S. ; Forney, James E. ; Stassinopoulos, E.G. ; Marshall, Paul ; Dale, Cheryl ; Kinnison, James ; Carkhuff, Bliss

  • Author_Institution
    NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • fYear
    1996
  • fDate
    35265
  • Firstpage
    19
  • Lastpage
    27
  • Abstract
    We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC converters
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; DRAM chips; EPROM; analogue integrated circuits; digital integrated circuits; ion beam effects; proton effects; space vehicle electronics; DC-DC converters; DRAM; EEPROM; analog devices; digital devices; heavy ion effects; proton effects; single event effect test results; spacecraft electronics; Aerospace electronics; Electronic equipment testing; Laboratories; Performance evaluation; Physics; Protons; Single event upset; Space vehicles; Test facilities; User centered design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1996., IEEE
  • Conference_Location
    Indian Wells, CA
  • Print_ISBN
    0-7803-3398-5
  • Type

    conf

  • DOI
    10.1109/REDW.1996.574184
  • Filename
    574184
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2832426