DocumentCode :
2832553
Title :
Complex express TEC testing
Author :
Yershova, L.B. ; Gromov, G.G. ; Drabkin, I.A.
Author_Institution :
RMT Ltd 53
fYear :
2003
fDate :
17-21 Aug. 2003
Firstpage :
504
Lastpage :
507
Abstract :
For fast (express) quality control of Thermoelectric (TE) Coolers (TEC) in manufacturing &d application, electrical resistance (R) and Figure-of-Merit (Z) measurements are widely used. Here it is shown that there are TEC damage or defect instances not covered by one-parameter testing (R) and even two-parameter testing (QZ). We offer a three-parameter approach to control TEC´s quality: by measuring TEC electrical resistance (R), Figure-of-Merit (Z) and time constant (τ). This method provides possibilities to diagnose TEC defects, which is of vital concern for technology and operational conditions correction. The paper yields theoretical and experimental results proving it. The experimental check is provided with the help of the original testing device R,Z,τ-meter DX3065.
Keywords :
Conducting materials; Electric resistance; Electrical resistance measurement; Manufacturing; Testing; Thermal conductivity; Thermoelectricity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Conference_Location :
La Grande Motte, France
Print_ISBN :
0-7803-8301-X
Type :
conf
DOI :
10.1109/ICT.2003.1287559
Filename :
1287559
Link To Document :
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