DocumentCode

2832839

Title

Extremely low loss circuit for megawatt average power switch testing

Author

Cavazos, T.C. ; Burkes, T.R. ; McDuff, G.

Author_Institution

Texas Tech University

fYear

1989

fDate

1989

Firstpage

536

Lastpage

542

Keywords

Circuit testing; Cooling; Costs; Life testing; Power supplies; Pulse shaping methods; RLC circuits; Switches; Switching circuits; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Pulsed Power Conference, 1989. 7th

Type

conf

DOI

10.1109/PPC.1989.767542

Filename

767542