Title :
Extremely low loss circuit for megawatt average power switch testing
Author :
Cavazos, T.C. ; Burkes, T.R. ; McDuff, G.
Author_Institution :
Texas Tech University
Keywords :
Circuit testing; Cooling; Costs; Life testing; Power supplies; Pulse shaping methods; RLC circuits; Switches; Switching circuits; Voltage;
Conference_Titel :
Pulsed Power Conference, 1989. 7th
DOI :
10.1109/PPC.1989.767542
