DocumentCode

2833558

Title

Test fast kicker pulser

Author

Zhang, W. ; Soukas, A.V. ; Zhang, S.Y. ; Frey, W.W. ; Bunicci, J.

Author_Institution

Brookhaven National Laboratory

fYear

1989

fDate

1989

Firstpage

725

Lastpage

728

Keywords

Capacitance; Circuit testing; Impedance; Inductance; Protons; Pulse circuits; Pulse measurements; Pulse shaping methods; Resistors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Pulsed Power Conference, 1989. 7th

Type

conf

DOI

10.1109/PPC.1989.767589

Filename

767589