Title :
Debugging sequential circuits using Boolean satisfiability
Author :
Ali, Moayad Fahim ; Veneris, Andreas ; Safarpour, Sean ; Abadir, Magdy ; Drechsler, Rolf ; Smith, Alexander
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
Logic debugging of today´s complex sequential circuits is an important problem. In this paper, a logic debugging methodology for multiple errors in sequential circuits with no state equivalence is developed. The proposed approach reduces the problem of debugging to an instance of Boolean satisfiability. This formulation takes advantage of modern Boolean satisfiability solvers that handle large circuits in a computationally efficient manner. An extensive suite of experiments with large sequential circuits confirm the robustness and efficiency of the proposed approach. The results further suggest that Boolean satisfiability provides an effective platform for sequential logic debugging.
Keywords :
computability; sequential circuits; Boolean satisfiability; sequential circuit debugging; sequential circuits; sequential logic debugging; Boolean functions; Computer bugs; Computer science; Debugging; Design automation; Fault diagnosis; Logic design; Robustness; Sequential circuits; Very large scale integration;
Conference_Titel :
Microprocessor Test and Verification (MTV'04), Fifth International Workshop on
Print_ISBN :
0-7695-2320-X