Title :
Cellular automata techniques for compaction based BIST
Author :
Miller, D.M. ; Muzio, J.C. ; Serra, M. ; Sun, X. ; Zhang, S. ; McLeod, R.D.
Author_Institution :
Dept. of Comput. Sci., Victoria Univ., BC, Canada
Abstract :
An overview is presented of the theory and application of cellular automata (CA) with respect to BIST (built-in self test). In particular, it is shown that CA should be given due consideration as a replacement for LFSRs (linear feedback shift registers). Further work is required to address implementation issues, as an LCAR (linear hybrid cellular automata register) generally requires greater area than an LFSR
Keywords :
built-in self test; logic testing; LCAR; built-in self test; cellular automata; compaction based BIST; implementation issues; linear feedback shift registers; linear hybrid cellular automata register; overview; response compaction; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Costs; Hardware; Polynomials; Registers; Vectors;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176777
