DocumentCode
2834074
Title
Bayesian wavelet-based image denoising using Markov Random Field models
Author
Cui, Yanqiu ; Zhang, Tao ; Xu, Shuang ; Li, Houjie
Author_Institution
Coll. of Electromech. & Inf. Eng., Dalian Nat. Univ., Dalian, China
Volume
1
fYear
2010
fDate
22-24 Oct. 2010
Abstract
This paper presents a Bayesian denoising method based on Markov Random Field (MRF) models in wavelet domain in order to improve the image denoising performance and reduce the computational complexity. The computations of the initial mask, optimal mask and shrinkage factor of the wavelet coefficient are the core of this method. To obtain the appropriate initial mask, a simple two-state Gaussian mixture model is constructed and an estimation method of the initial mask based on the maximum a posteriori (MAP) criterion is proposed. Based on this initial mask, an optimal mask is obtained. To reduce the computational complexity of the optimal mask, a simple optimization method, the iterated conditional modes (ICM) method is adopted. A Bayesian wavelet shrinkage factor is derived based on this optical mask. Under this framework, the computational complexity of the denoising method can be reduced. Simulation results demonstrate our proposed method has a good denoising performance while reducing the computational complexity.
Keywords
Gaussian processes; Markov processes; belief networks; computational complexity; image denoising; maximum likelihood estimation; optimisation; shrinkage; wavelet transforms; Bayesian denoising method; Bayesian wavelet based image denoising; Gaussian mixture model; Markov random field model; computational complexity; estimation method; iterated conditional modes method; maximum a posteriori criterion; shrinkage factor; wavelet coefficient; wavelet domain; Bayesian methods; Computational modeling; IEL; Spline; Bayesian estimation; Markov Random Field; image denoising; wavelet;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location
Taiyuan
Print_ISBN
978-1-4244-7235-2
Electronic_ISBN
978-1-4244-7237-6
Type
conf
DOI
10.1109/ICCASM.2010.5620417
Filename
5620417
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