DocumentCode
2834100
Title
Facilitating testability of TLM FIFO: SystemC implementations
Author
Alemzadeh, Homa ; Cimei, Marco ; Prinetto, Paolo ; Navabi, Zainalabedin
Author_Institution
ECE Dept., CAD Res. Group, Univ. of Tehran, Tehran, Iran
fYear
2010
fDate
17-20 Sept. 2010
Firstpage
428
Lastpage
431
Abstract
TLM is a high-level approach to modeling digital systems with an emphasis on separating computations from communications within a system. With the evolution of design methodologies to transaction level the need for definition of DFT (Design for Test) techniques at this very high level of abstraction arises. This paper focuses on the implementation of three different high-level testing strategies for TLM FIFO as the basic TLM communication channel. These strategies are implemented by adding Built-in Functional Self Test (BIFST) utilities to the channels and computation units. We present SystemC implementations of the utilities that we have developed in the form of new SystemC classes and methods.
Keywords
automatic testing; design for testability; SystemC implementations; TLM FIFO; TLM communication channel; built-in functional self test; design for test; digital systems; facilitating testability; transaction level modeling; Communication channels; Computational modeling; Computer architecture; Design methodology; Testing; Time domain analysis; Time varying systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location
St. Petersburg
Print_ISBN
978-1-4244-9555-9
Type
conf
DOI
10.1109/EWDTS.2010.5742035
Filename
5742035
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