• DocumentCode
    2834212
  • Title

    A high resolution time-to-digital converter using two-level vernier delay line technique

  • Author

    Li, G.H. ; Chou, H.P.

  • Volume
    1
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    276
  • Lastpage
    280
  • Abstract
    This paper describes the design of time-to- digital converter ( TDC ) with two level Vernier delay line (VDL) , which is used to solve the problem of long conversion time in single level VDL and reduce the number of elements. The time interval to be measured between two pulse signals is separated into integral period part and non-integral period part by control circuit. Integral part is sent to counter, and non-integral parts are sent to the two level VDL. In the first VDL can get coarse resolution ( Tclk/N ) , and the signals will be transmitted to the second VDL by the proposed interface circuit. Fine resolution (Tclk/N2) can be gotten in the second VDL. Finally, readout circuit converts thermal code to binary code and do the subtraction to obtain the final results. The bias voltage of delay elements in VDL is controlled by DLL, this makes delay elements can stably provide two kinds of delay time for VDL. The circuit is realized with the process of TSMC CMOS 0.18 um 1P6M. 200 Mhz clock frequency is chosen in the circuit. From the simulation results, the conversion time is smaller than 5 clock periods, the maximum time can be measured is 75 ns. After the fine resolution is modified to 29.6 ps, the DNL is within -0.33LSB - +0.69LSB , and INLis within +0.47LSB - +1.08LSB.
  • Keywords
    CMOS integrated circuits; nuclear electronics; readout electronics; TSMC CMOS; frequency 200 MHz; high resolution time-to-digital converter; pulse signal time interval; readout circuit; two-level Vernier delay line technique; Binary codes; Clocks; Counting circuits; Delay effects; Delay lines; Pulse circuits; Pulse measurements; Signal resolution; Time measurement; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4436330
  • Filename
    4436330