DocumentCode :
2834453
Title :
A macromodeling based approach for efficient IC yield optimization
Author :
Feldman, Peter ; Director, Stephen W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1991
fDate :
11-14 Jun 1991
Firstpage :
2260
Abstract :
The authors describe a local macromodeling methodology that approximates circuit performance by low-order polynomials in terms of process disturbance variables with coefficients dependent on the designable circuit parameters. The macromodels obtained as a result of a relatively small number of circuit simulations are shown to be useful in predicting circuit yield, yield gradient, and the distribution of circuit performances. The effectiveness of this macromodeling approach is demonstrated in the context of statistical optimization
Keywords :
circuit analysis computing; integrated circuit manufacture; modelling; optimisation; IC yield optimization; circuit simulations; designable circuit parameters; low-order polynomials; macromodeling; predicting circuit yield; process disturbance variables; statistical optimization; yield enhancement; yield gradient; Circuit optimization; Circuit simulation; Computational modeling; Design optimization; Fabrication; Monte Carlo methods; Optimization methods; Performance analysis; Polynomials; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
Type :
conf
DOI :
10.1109/ISCAS.1991.176830
Filename :
176830
Link To Document :
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