Exploring modeling and testing of NAND flash memories

Testing NAND flash memories is a very complex issue due to the rapid scaling down of the technology and the related floating gate reliability issues: as a consequence a complete and technology independent test is needed. Several faults and disturbances were identified both for NOR and NAND flash memories: however they has never been considered together as a whole. In this work we analyze all the possible fault models for NAND flash memories: thus we define a comprehensive and technology independent fault model for NAND Flash memories, for which a simple but comprehensive test method is presented.