DocumentCode
2834616
Title
Automated test bench generation for high-level synthesis flow ABELITE
Author
Viilukas, Taavi ; Jenihhin, Maksim ; Raik, Jaan ; Ubar, Raimund ; Baranov, Samary
Author_Institution
Tallinn Univ. of Technol., Tallinn, Estonia
fYear
2011
fDate
9-12 Sept. 2011
Firstpage
13
Lastpage
16
Abstract
The paper presents an approach for integration of automatic test bench generation based on a hierarchical test pattern generator Decider into the high-level synthesis flow Abelite. While the high-level synthesis flow provides fast results of complex systems design, functional verification of the design including initial specification has remained until now a sophisticated manual process. The automatically generated test benches provide high code coverage for simulation and are readable for debug. The experiments demonstrate viability and efficiency of the proposed approach.
Keywords
automatic test pattern generation; high level synthesis; ABELITE; automated test bench generation; hierarchical test pattern generator; high code coverage; high level synthesis flow; Algorithm design and analysis; Circuit faults; Digital systems; Hardware design languages; Object oriented modeling; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium (EWDTS), 2011 9th East-West
Conference_Location
Sevastopol
Print_ISBN
978-1-4577-1957-8
Type
conf
DOI
10.1109/EWDTS.2011.6116601
Filename
6116601
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