• DocumentCode
    2834616
  • Title

    Automated test bench generation for high-level synthesis flow ABELITE

  • Author

    Viilukas, Taavi ; Jenihhin, Maksim ; Raik, Jaan ; Ubar, Raimund ; Baranov, Samary

  • Author_Institution
    Tallinn Univ. of Technol., Tallinn, Estonia
  • fYear
    2011
  • fDate
    9-12 Sept. 2011
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    The paper presents an approach for integration of automatic test bench generation based on a hierarchical test pattern generator Decider into the high-level synthesis flow Abelite. While the high-level synthesis flow provides fast results of complex systems design, functional verification of the design including initial specification has remained until now a sophisticated manual process. The automatically generated test benches provide high code coverage for simulation and are readable for debug. The experiments demonstrate viability and efficiency of the proposed approach.
  • Keywords
    automatic test pattern generation; high level synthesis; ABELITE; automated test bench generation; hierarchical test pattern generator; high code coverage; high level synthesis flow; Algorithm design and analysis; Circuit faults; Digital systems; Hardware design languages; Object oriented modeling; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (EWDTS), 2011 9th East-West
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4577-1957-8
  • Type

    conf

  • DOI
    10.1109/EWDTS.2011.6116601
  • Filename
    6116601