Title :
IEE Colloquium on `Computer Aided Test and Diagnosis´ (Digest No.100)
Abstract :
The following topics were dealt with: functional testing; testability; expert systems; fault testing; integrated tools. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords :
automatic test equipment; automatic testing; integrated circuit testing; printed circuit testing; expert systems; fault testing; functional testing; integrated tools; testability;
Conference_Titel :
Computer Aided Test and Diagnosis, IEE Colloquium on
Conference_Location :
London
