Title :
Design fault injection-based technique and tool for FPGA projects verification
Author :
Reva, L. ; Kulanov, V. ; Kharchenko, V.
Author_Institution :
Nat. Aerosp. Univ. named after N.E. Zhukovsky KhAI, Ukraine
Abstract :
Design fault injection-based technique (DBIT) is proposed to implement a procedure of independent verification. The possible options of the proposed DBIT application are presented. The developed design fault profiling and injection tool is described. It is given an example of fault profiling and injection carrying out by the developed tool.
Keywords :
fault diagnosis; field programmable gate arrays; DBIT; FPGA project verification; design fault injection-based technique; fault injection tool; fault profiling; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Graphical user interfaces; Safety;
Conference_Titel :
Design & Test Symposium (EWDTS), 2011 9th East-West
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-1957-8
DOI :
10.1109/EWDTS.2011.6116608
