DocumentCode
2834743
Title
Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers
Author
Micskei, Zoltán ; Majzik, István
Author_Institution
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ.
fYear
2006
fDate
25-27 May 2006
Firstpage
191
Lastpage
198
Abstract
Testing is an essential, but time and resource consuming activity in the software development process. In the case of model-based development, among other subtasks test construction and test execution can be partially automated. Our paper describes the implementation of a test generator framework that uses an external model checker to construct test sequences. The possible configurations of the model checker are examined by measuring the efficiency of test construction in the case of different statechart models of event-driven embedded systems. The generated test cases are transformed and executed on common testing frameworks (JUnit, rational robot) and the effectiveness of tests are measured using code coverage metrics
Keywords
automatic test pattern generation; embedded systems; formal specification; program testing; JUnit; code coverage metrics; event-driven embedded system; model checking; model-based automatic test generation; model-based development; rational robot; software development process; statechart model; Automatic testing; Embedded system; Information systems; Programming; Robots; Software measurement; Software testing; State-space methods; System testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependability of Computer Systems, 2006. DepCos-RELCOMEX '06. International Conference on
Conference_Location
Szklarska Poreba
Print_ISBN
0-7695-2565-2
Type
conf
DOI
10.1109/DEPCOS-RELCOMEX.2006.37
Filename
4024049
Link To Document