• DocumentCode
    2834743
  • Title

    Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

  • Author

    Micskei, Zoltán ; Majzik, István

  • Author_Institution
    Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ.
  • fYear
    2006
  • fDate
    25-27 May 2006
  • Firstpage
    191
  • Lastpage
    198
  • Abstract
    Testing is an essential, but time and resource consuming activity in the software development process. In the case of model-based development, among other subtasks test construction and test execution can be partially automated. Our paper describes the implementation of a test generator framework that uses an external model checker to construct test sequences. The possible configurations of the model checker are examined by measuring the efficiency of test construction in the case of different statechart models of event-driven embedded systems. The generated test cases are transformed and executed on common testing frameworks (JUnit, rational robot) and the effectiveness of tests are measured using code coverage metrics
  • Keywords
    automatic test pattern generation; embedded systems; formal specification; program testing; JUnit; code coverage metrics; event-driven embedded system; model checking; model-based automatic test generation; model-based development; rational robot; software development process; statechart model; Automatic testing; Embedded system; Information systems; Programming; Robots; Software measurement; Software testing; State-space methods; System testing; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependability of Computer Systems, 2006. DepCos-RELCOMEX '06. International Conference on
  • Conference_Location
    Szklarska Poreba
  • Print_ISBN
    0-7695-2565-2
  • Type

    conf

  • DOI
    10.1109/DEPCOS-RELCOMEX.2006.37
  • Filename
    4024049