DocumentCode :
2834743
Title :
Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers
Author :
Micskei, Zoltán ; Majzik, István
Author_Institution :
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ.
fYear :
2006
fDate :
25-27 May 2006
Firstpage :
191
Lastpage :
198
Abstract :
Testing is an essential, but time and resource consuming activity in the software development process. In the case of model-based development, among other subtasks test construction and test execution can be partially automated. Our paper describes the implementation of a test generator framework that uses an external model checker to construct test sequences. The possible configurations of the model checker are examined by measuring the efficiency of test construction in the case of different statechart models of event-driven embedded systems. The generated test cases are transformed and executed on common testing frameworks (JUnit, rational robot) and the effectiveness of tests are measured using code coverage metrics
Keywords :
automatic test pattern generation; embedded systems; formal specification; program testing; JUnit; code coverage metrics; event-driven embedded system; model checking; model-based automatic test generation; model-based development; rational robot; software development process; statechart model; Automatic testing; Embedded system; Information systems; Programming; Robots; Software measurement; Software testing; State-space methods; System testing; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependability of Computer Systems, 2006. DepCos-RELCOMEX '06. International Conference on
Conference_Location :
Szklarska Poreba
Print_ISBN :
0-7695-2565-2
Type :
conf
DOI :
10.1109/DEPCOS-RELCOMEX.2006.37
Filename :
4024049
Link To Document :
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