• DocumentCode
    2834839
  • Title

    Architecture design and technical methodology for bus testing

  • Author

    Haghbayan, M.H. ; Navabi, Z.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2010
  • fDate
    17-20 Sept. 2010
  • Firstpage
    504
  • Lastpage
    509
  • Abstract
    In this paper we present an architecture and corresponding algorithm for bus testing in the System on Chip (SoC) design. In our test methodology we used hierarchical functional testing to test all available components in a bus except cores of the SoC as fast as possible. According to our proposed method, first small components and wires are tested and then, higher level operations of the bus (like burst transfers) will be tested. For each step of bus testing, an architecture is proposed. We show the efficiency of our proposed method using a real SoC as experimental result.
  • Keywords
    logic testing; system-on-chip; bus testing; hierarchical functional testing; system on chip design; Logic gates; Multiplexing; Random access memory; Solids; System-on-a-chip; Testing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (EWDTS), 2010 East-West
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    978-1-4244-9555-9
  • Type

    conf

  • DOI
    10.1109/EWDTS.2010.5742078
  • Filename
    5742078