DocumentCode
2834839
Title
Architecture design and technical methodology for bus testing
Author
Haghbayan, M.H. ; Navabi, Z.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear
2010
fDate
17-20 Sept. 2010
Firstpage
504
Lastpage
509
Abstract
In this paper we present an architecture and corresponding algorithm for bus testing in the System on Chip (SoC) design. In our test methodology we used hierarchical functional testing to test all available components in a bus except cores of the SoC as fast as possible. According to our proposed method, first small components and wires are tested and then, higher level operations of the bus (like burst transfers) will be tested. For each step of bus testing, an architecture is proposed. We show the efficiency of our proposed method using a real SoC as experimental result.
Keywords
logic testing; system-on-chip; bus testing; hierarchical functional testing; system on chip design; Logic gates; Multiplexing; Random access memory; Solids; System-on-a-chip; Testing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location
St. Petersburg
Print_ISBN
978-1-4244-9555-9
Type
conf
DOI
10.1109/EWDTS.2010.5742078
Filename
5742078
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