Title :
Accurate timing simulation of gallium arsenide circuits
Author :
Bernhardt, Bruce A. ; Sobelman, Gerald E.
Author_Institution :
Motorola, Inc., Tempe, AZ, USA
Abstract :
Due to the differing topologies and physics between silicon MOSFET and gallium arsenide MESFET systems, the algorithms previously developed for timing simulation of silicon MOS circuits are ineffective for gallium arsenide MESFET circuits. The authors briefly describe some of these limitations and their impact on simulator development. An algorithm for the efficient timing simulation of large scale GaAs MESFET digital integrated circuits that correctly models the physics is then developed. The approach is shown to be an order of magnitude faster than circuit level simulations but at comparable accuracy. This simulator effectively models the nonlinear voltage dependent junction capacitances for timing analysis purposes and utilizes relaxation based methods to de-couple the system of equations
Keywords :
III-V semiconductors; Schottky gate field effect transistors; circuit analysis computing; digital integrated circuits; digital simulation; field effect integrated circuits; gallium arsenide; GS simulator; GaAs; MESFET circuits; digital integrated circuits; large scale; nonlinear voltage dependent junction capacitances; relaxation based methods; timing simulation; Circuit simulation; Circuit topology; Gallium arsenide; Large scale integration; MESFET circuits; MESFET integrated circuits; MOSFET circuits; Physics; Silicon; Timing;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176864