DocumentCode :
2835040
Title :
A smart measurement system for reconstructing voltage rms value over long time interval
Author :
Peretto, L. ; Tinarelli, R.
Author_Institution :
Dipt. di Ingegneria Elettrica, Bologna Univ., Italy
fYear :
2004
fDate :
12-15 Sept. 2004
Firstpage :
507
Lastpage :
511
Abstract :
Determining the trend over long time interval of parameters characterizing electrical power systems usually requires high storage capacity. The authors have proposed a measurement technique, based on both a random sampling strategy and a statistical approach, which allows to reconstruct the trend of a given parameter by processing a very limited amount of data. In this paper, a smart system implementing such a technique is presented. It is a microcontroller-based device devoted to the acquisition of the rms values on low voltage systems. The results of some experimental tests showing the good performance of the implemented device are also presented and discussed.
Keywords :
digital signal processing chips; microcontrollers; power system measurement; statistical analysis; DSP; digital signal processor; electrical power systems; low voltage systems; microcontroller device; parameter characterization; random sampling strategy; rms value; smart measurement system; statistical analysis; Electric variables measurement; Instruments; Low voltage; Measurement techniques; Power measurement; Power system measurements; Sampling methods; Statistical analysis; Testing; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Harmonics and Quality of Power, 2004. 11th International Conference on
Print_ISBN :
0-7803-8746-5
Type :
conf
DOI :
10.1109/ICHQP.2004.1409406
Filename :
1409406
Link To Document :
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