Title :
Sieves and wavelets: multiscale transforms for pattern recognition
Author :
Bangham, J. Andrew ; Campbell, T. George
Author_Institution :
Tampere University of Technology, Finland
Keywords :
Data mining; Filter bank; Finite impulse response filter; Frequency; Information systems; Nonlinear filters; Pattern matching; Pattern recognition; Testing; Wavelet transforms;
Conference_Titel :
Nonlinear Digital Signal Processing, 1993. IEEE Winter Workshop on
Print_ISBN :
951-721-944-X
DOI :
10.1109/NDSP.1993.767679
