Title :
The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits
Author :
Ahmad, A. ; Nanda, N.K. ; Garg, K.
Author_Institution :
Dept. of Electron. & Comput. Eng., Roorkee Univ., India
Abstract :
The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial feeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits
Keywords :
logic testing; polynomials; shift registers; LFSR; LFSR based testing; data compression; digital circuits; irreducible characteristic polynomials; linear feedback shift register; polynomial seeds; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computational modeling; Computer science; Computer simulation; Digital circuits; Educational institutions; Polynomials;
Conference_Titel :
TENCON '89. Fourth IEEE Region 10 International Conference
Conference_Location :
Bombay
DOI :
10.1109/TENCON.1989.176866
