DocumentCode
2835544
Title
On selection of state variables for delay test of identical functional units
Author
Kajala, Aditi ; Sinsinwar, Gayaprasad ; Choudhary, Rahul Raj ; Tudu, Jaynarayan ; Singh, Virendra
Author_Institution
Govt. Eng. Coll., Bikaner, India
fYear
2010
fDate
17-20 Sept. 2010
Firstpage
200
Lastpage
203
Abstract
Multiple copies of the same functional units are common in today´s design. It allows us to reduce golden reference storage by performing comparison of output response of the identical circuits when identical input sequence is applied to them. We present output response comparison scheme for identical sequential circuits for delay test using static transition probability. This allows us to make selection independent of the input sequence.
Keywords
delays; fault diagnosis; logic testing; probability; sequential circuits; delay test; golden reference storage; identical circuits; identical functional units; identical input sequence; identical sequential circuits; state variable selection; static transition probability; Automatic test pattern generation; Circuit faults; Delay; Fault detection; Probability; Routing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location
St. Petersburg
Print_ISBN
978-1-4244-9555-9
Type
conf
DOI
10.1109/EWDTS.2010.5742119
Filename
5742119
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