Title :
Self-testing of microcontrollers in the field
Author :
Sosnowski, Janusz
Author_Institution :
Inst. of Comput. Sci., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
The paper presents our experience with developing tests for microcontroller based embedded systems. We use application specific tests. They are integrated with the implemented application (program) and available on-line error detection mechanisms. The effectiveness of this approach has been analyzed in simulation experiments and referenced to some practical problem in embedded systems.
Keywords :
automatic testing; embedded systems; error detection; microcontrollers; application specific test; embedded system; microcontroller; online error detection mechanism; self testing; Computer architecture; Embedded systems; Hardware; Program processors; Random access memory; Testing;
Conference_Titel :
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4244-9555-9
DOI :
10.1109/EWDTS.2010.5742137
