Title :
Multi-branched diagnostic trees
Author :
Tong, David W. ; Jolly, Christopher H. ; Zalondek, Kevin C.
Author_Institution :
General Electric Corp., Schenectady, NY, USA
Abstract :
The authors describe the application of quantitative model-based reasoning to the automatic generation of multi-branched diagnostic trees using only a system model description containing connectivity and functional information. The technique is demonstrated using two examples, diagnosing a simple adder-multiplier circuit and a more complex analog feedback control system. Quantitative measures are defined for the performance of the generated trees, and data show that both diagnostic accuracy and efficiency increase with larger branching factors. This technique is believed to hold significant potential for increasing the productivity of developing fault isolation test programs
Keywords :
fault location; inference mechanisms; adder-multiplier circuit; analog feedback control system; connectivity; diagnostic accuracy; efficiency; fault isolation test programs; functional information; multi-branched diagnostic trees; quantitative model-based reasoning; Binary trees; Circuit faults; Circuit testing; Electric variables measurement; Electronic circuits; Fault detection; Feedback circuits; Feedback control; Feedback loop; Inference mechanisms;
Conference_Titel :
Systems, Man and Cybernetics, 1989. Conference Proceedings., IEEE International Conference on
Conference_Location :
Cambridge, MA
DOI :
10.1109/ICSMC.1989.71258