DocumentCode :
283681
Title :
Operational experiences in the use of power semiconductors in large power systems
Author :
Drury, W. ; Thoburn, R.
fYear :
1988
fDate :
32484
Firstpage :
42491
Lastpage :
42493
Abstract :
The authors discuss two types of power semiconductor failure they have experienced. These are, time related degradation failure, and random event failure. The examples given for each type of failure are, a pulsed power supply, and traction power converters
fLanguage :
English
Publisher :
iet
Conference_Titel :
Very High Power Converter Devices and Applications, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
209747
Link To Document :
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