DocumentCode
283681
Title
Operational experiences in the use of power semiconductors in large power systems
Author
Drury, W. ; Thoburn, R.
fYear
1988
fDate
32484
Firstpage
42491
Lastpage
42493
Abstract
The authors discuss two types of power semiconductor failure they have experienced. These are, time related degradation failure, and random event failure. The examples given for each type of failure are, a pulsed power supply, and traction power converters
fLanguage
English
Publisher
iet
Conference_Titel
Very High Power Converter Devices and Applications, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
209747
Link To Document