Detecting spurious reflections in integrated photonic devices

Author

Halir, Robert ; Molina-Fernandez, I. ; Ortega-Monux, A. ; Cheben, Pavel ; Janz, Siegfried ; Xu, Dan-Xia

Author_Institution

Dept. Ing. de Comun., Univ. de Malaga, Malaga, Spain

fYear

2009

fDate

14-19 June 2009

Firstpage

1

Lastpage

1

Abstract

Spurious reflections can be a problematic issue in integrated optical devices, such as lasers, detectors, or multi-mode interference (MMI) couplers. Here we demonstrate a simple method to localize such faint reflections occurring inside the chip, using only wavelength-swept power transmission measurements. The method does not require a special measurement setup and is based on minimum phase techniques, which were recently proposed for integrated optical device characterization.

Keywords

integrated optics; optical couplers; power transmission; integrated optical device; integrated photonic devices; multimode interference couplers; power transmission measurements; spurious reflection detection; Couplers; Optical devices; Optical interferometry; Optical reflection; Optical waveguides; Phase measurement; Power measurement; Power transmission; Semiconductor device measurement; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-4079-5

Electronic_ISBN

978-1-4244-4080-1

Type

conf

DOI

10.1109/CLEOE-EQEC.2009.5194808

Filename

5194808