DocumentCode :
2837432
Title :
Space mapping and beyond: Knowledge-driven microwave design optimization
Author :
Koziel, Slawomir ; Madsen, Kaj
Author_Institution :
Engineering Optimization & Modeling Center, School of Science and Engineering, Reykjavik University, Menntavegur 1, 101, Iceland
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
Design closure exploiting electromagnetic (EM) solvers has become one of the fundamental design tools in contemporary microwave engineering. For many structures, adjustment of geometry and/or material parameters can only be done through repetitive EM simulations because analytical design formulas either do not exist or can only provide initial designs that need to be further refined. Unfortunately, EM-driven optimization is a challenging problem with the major bottleneck being a high computational cost of accurate simulation. This problem can be alleviated by using fast and yet reliable surrogate models that can replace the CPU-intensive EM-simulated structure of interest in the search for optimum design. The surrogate models exploiting physically-based low-fidelity models (e.g., circuit equivalents) can be particularly efficient: the knowledge about the structure under design embedded in such a low-fidelity model allows us to dramatically reduce the number of EM simulations necessary to find a satisfactory design. Here, we review the concept of knowledge-driven design as well as specific design techniques, including space mapping, simulation-based tuning, and various response correction methods. Discussion on open problems and perspectives of these methodologies is also included.
Keywords :
Computational modeling; Integrated circuit modeling; Microwave circuits; Microwave filters; Solid modeling; Tuning; Computer-aided design (CAD); knowledge-driven design; simulation-based tuning; space mapping; surrogate modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6257773
Filename :
6257773
Link To Document :
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