DocumentCode :
2837554
Title :
Intelligent CMOS control of RF MEMS capacitive switches
Author :
Ding, G. ; Wang, W. ; Halder, S. ; Palego, C. ; Molinero, D. ; Hwang, J.C.M. ; Goldsmith, C.L.
Author_Institution :
Lehigh University, Bethlehem, PA 18015, USA
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
A CMOS control circuit capable of closed-loop capacitance sensing and control of RF MEMS switches was designed, fabricated, and tested. The control was based on fine-tuning the magnitude of the bias voltage of the switches according to the difference between sensed and targeted capacitances. Intelligence could be programmed by periodically alternating the sign of the bias voltage when its magnitude to maintain the targeted capacitance drifted significantly due to dielectric charging. Such an intelligent control could also be used to compensate for process variation, ambient temperature change, and RF power loading, which would make RF MEMS capacitive switches not only more reliable, but also more robust.
Keywords :
CMOS integrated circuits; Capacitance; Micromechanical devices; Microswitches; Radio frequency; Sensors; Closed loop systems; capacitance measurement; capacitance-voltage characteristics; intelligent control; radio-frequency micro-electromechanical systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6257781
Filename :
6257781
Link To Document :
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