Title :
Measurement of high-speed photodiodes using a microwave reflectometer to improve accuracy
Author :
Gifford, A.D. ; Humphreys, D.A.
Author_Institution :
Div. of Electr. Sci., NPL, Teddington, UK
Abstract :
A novel single-detector microwave reflectometer technique which corrects source mismatch errors is presented. Scalar optoelectronic measurements are used to determine the corrected optoelectronic response and the vector reflection coefficient of a high-speed photodiode. A GaInAs photodiode has been measured up to 40 GHz using a distributed feedback laser heterodyne system at 1532 nm. Results corrected for source mismatch using reflection coefficient measurements are compared with the results with the single-detector reflectometer technique
Keywords :
III-V semiconductors; frequency response; gallium arsenide; indium compounds; microwave reflectometry; optical variables measurement; photodiodes; 1532 nm; 40 GHz; GaInAs photodiode; III-V semiconductor; distributed feedback laser heterodyne system; high-speed photodiodes; optoelectronic response; single-detector microwave reflectometer technique; source mismatch errors; vector reflection coefficient;
Conference_Titel :
Measurements on Optical Devices, IEE Colloquium on
Conference_Location :
London
