The measurement of refractive index in the visible and infrared at NPL

Author

Talim, S.P.

Author_Institution

NPL, Teddington, UK

fYear

1992

fDate

33927

Firstpage

42491

Lastpage

42495

Abstract

NPL offer the refractive index measurement facilities over a wide spectral range for bulk materials and thin films. Some of these facilities may be suitable for optical waveguide device measurements. The new method under investigation using a confocal microscope show great promise, however much calibration work is necessary before an estimation of uncertainty can be made. Evanescent field microscopy require further investigations

Keywords

optical microscopes; optical microscopy; optical waveguides; refractive index measurement; NPL facilities; bulk materials; confocal microscope; evanescent field microscopy; infrared; optical waveguide device measurements; refractive index measurement facilities; thin films; visible; wide spectral range;

fLanguage

English

Publisher

iet

Conference_Titel

Measurements on Optical Devices, IEE Colloquium on

Conference_Location

London

Type

conf

Filename

211786

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=283801