DocumentCode :
283802
Title :
Optical confinement in (AlGa)InP visible emitting laser diodes
Author :
Griffiths, K. ; Burke, S.V. ; Blood, P.
Author_Institution :
Dept. of Phys. & Astron., Univ. of Wales Coll. of Cardiff, UK
fYear :
1992
fDate :
33927
Firstpage :
42461
Lastpage :
42469
Abstract :
Measurement of the far-field pattern of bulk and quantum well GaInP lasers have been used to determine optical confinement factor for individual laser diodes under operating conditions. Using the experimentally determined far-field pattern to find the optical confinement factor has been shown to be a useful tool where there is uncertainty in the refractive index and composition data for laser diodes. Another advantage of this method over theoretical calculations is that the optical confinement factor is determined for individual lasers under operating conditions, hence the effects of temperature and carrier injection on the refractive index are automatically taken into account
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; laser variables measurement; semiconductor lasers; AlGaInP visible emitting laser diodes; III-V semiconductors; bulk; carrier injection; effects of temperature; far-field pattern; operating conditions; optical confinement factor; quantum well; refractive index;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Measurements on Optical Devices, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
211787
Link To Document :
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