A semi-automated measurement system for integrated optics

Test equipment capable of making semi-automated measurements has been developed. The equipment is capable of rapidly characterising silica-on-silicon test components. The equipment enables devices to be measured to a worst case accuracy of ±0.24 dB and a typical accuracy better than ±0.1 dB. The test equipment enables test designs to be evaluated so that optimised designs can be fabricated with V-grooves to produce fibre pigtailed devices