Title :
Structural analysis of large digital circuits
Author :
Pan, Yuqi ; Li, Zhongcheng ; Min, Yinghua
Author_Institution :
CAD Lab., Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Abstract :
Structural analysis of large circuits is very important for circuit design and test. The paper gives a generic structural model of large circuits and proposes a new concept of separated-cone. An algorithm is given to partition a circuit into separated-cones, and to find all the maximal-supergates in each separated-cone. After partitioning, the circuit fits for the generic structural model. This kind of partition is significant for design for testability, test generation, and fault simulation. It is interesting to explore the principle of hard-faults concentration, which means faults that are hard to detect are concentrated on a few separated-cones. Finally, the partitioning results of the 10 IS-CAS benchmark circuits are given
Keywords :
design for testability; digital integrated circuits; fault tolerant computing; logic design; logic testing; IS-CAS benchmark circuits; circuit design; circuit partitioning; circuit test; design for testability; digital circuits; fault simulation; hard-faults concentration; maximal-supergates; separated-cone; structural analysis; test generation; Circuit analysis; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Design for testability; Digital circuits; Electrical fault detection; Fault detection; Partitioning algorithms;
Conference_Titel :
Fault Tolerant Systems, 1991. Proceedings., Pacific Rim International Symposium on
Conference_Location :
Kawasaki
Print_ISBN :
0-8186-2275-X
DOI :
10.1109/{RFTS.1991.212954
