Production experience with built-in self-test in the IBM ES/9000 system

This paper describes the performance of the Self-Test System used in the production of circuit modules for the new line of mainframes, the ES/9000 series. The system supports pseudorandom patterns generated and applied in a self-test mode from within the module, as well as control and pseudorandom stimuli and response compression through the IjO pins. Simulation-based diagnostics are used to generate repair actions to specific micro-nets, with an associated confidence level. Modules (containing roughly 500,000 gates) are being verified in under 3 minutes, with diagnosis of failing modules resulting in the isolation of a fault with 5 minutes of on-line time, followed by 11.7 minutes of off-line analysis.