• DocumentCode
    2838562
  • Title

    An Extension of "SEQ-NV-RANSAC" Approach To Avoid Bad-Segmentation Cases From Unstructured 3D Point Clouds Using Topology Information

  • Author

    Awwad, Tarek M. ; Zhu, Qing ; Li, Qiaoxiong

  • Author_Institution
    State Key Lab. of Inf. Eng. in Surveying, Wuhan Univ., Wuhan, China
  • fYear
    2009
  • fDate
    19-20 Dec. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Recently many applications require an automatic processing of massive unstructured 3D point clouds in order to extract planar surfaces of man-made objects. While segmentation is the essential step in feature extracting process, but bad-segmentation results (i.e. under and over-segmentation) are still standing as a big obstacle to extract planar surfaces with best fit reality. In this paper, we propose an extension of "SEQ-NVRANSAC" approach to avoid the bad-segmentation problems using topology information and intuitive threshold value. First, in order to avoid the under-segmentation problem, we check each one group which resulted from original "SEQ-NV-RANSAC" approach to get all neighbours points which have Euclidean distance less than the threshold value as a one surface group. This process will be repeated until no more points can be adding to that surface group. Then a new surface group will be created to check the remaining points. Second, in order to solve the oversegmentation, we propose three checks; the similarity of normal vectors (NV), the perpendicular distance and the intersection zone using bounding box test.
  • Keywords
    feature extraction; image segmentation; Euclidean distance; SEQ-NV-RANSAC approach; bad segmentation problems; feature extraction process; intersection zone; intuitive threshold value; perpendicular distance; planar surface extraction; topology information; unstructured 3D point cloud automatic processing; Clouds; Data mining; Euclidean distance; Feature extraction; Laboratories; Remote sensing; Shape; Surface fitting; Testing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Engineering and Computer Science, 2009. ICIECS 2009. International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-4994-1
  • Type

    conf

  • DOI
    10.1109/ICIECS.2009.5364608
  • Filename
    5364608