DocumentCode :
2838562
Title :
An Extension of "SEQ-NV-RANSAC" Approach To Avoid Bad-Segmentation Cases From Unstructured 3D Point Clouds Using Topology Information
Author :
Awwad, Tarek M. ; Zhu, Qing ; Li, Qiaoxiong
Author_Institution :
State Key Lab. of Inf. Eng. in Surveying, Wuhan Univ., Wuhan, China
fYear :
2009
fDate :
19-20 Dec. 2009
Firstpage :
1
Lastpage :
4
Abstract :
Recently many applications require an automatic processing of massive unstructured 3D point clouds in order to extract planar surfaces of man-made objects. While segmentation is the essential step in feature extracting process, but bad-segmentation results (i.e. under and over-segmentation) are still standing as a big obstacle to extract planar surfaces with best fit reality. In this paper, we propose an extension of "SEQ-NVRANSAC" approach to avoid the bad-segmentation problems using topology information and intuitive threshold value. First, in order to avoid the under-segmentation problem, we check each one group which resulted from original "SEQ-NV-RANSAC" approach to get all neighbours points which have Euclidean distance less than the threshold value as a one surface group. This process will be repeated until no more points can be adding to that surface group. Then a new surface group will be created to check the remaining points. Second, in order to solve the oversegmentation, we propose three checks; the similarity of normal vectors (NV), the perpendicular distance and the intersection zone using bounding box test.
Keywords :
feature extraction; image segmentation; Euclidean distance; SEQ-NV-RANSAC approach; bad segmentation problems; feature extraction process; intersection zone; intuitive threshold value; perpendicular distance; planar surface extraction; topology information; unstructured 3D point cloud automatic processing; Clouds; Data mining; Euclidean distance; Feature extraction; Laboratories; Remote sensing; Shape; Surface fitting; Testing; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Engineering and Computer Science, 2009. ICIECS 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4994-1
Type :
conf
DOI :
10.1109/ICIECS.2009.5364608
Filename :
5364608
Link To Document :
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