Title :
A practical model for calculation of the proton induced SEU cross section using experimental heavy ion SEU cross sections
Author :
Akkerman, A. ; Lifshitz, Y. ; Levinson, J. ; Hass, M. ; Ilberg, D.
Author_Institution :
Soreq Nucl. Res. Center, Yavne, Israel
Abstract :
Calculations of the proton induced SEU cross sections were performed using the experimental heavy ion SEU cross sections and a simplified model for estimation of the nuclear recoils (fragments) LET distribution. The results of the calculations were verified by comparing them to experimental and other calculational data showing that the proposed approach can be used for quick and practical estimations of the upset rate
Keywords :
Monte Carlo methods; electronic engineering computing; ion beam effects; proton effects; semiconductor device models; LET distribution; Monte Carlo calculations; heavy ion SEU cross sections; model; nuclear recoils; proton induced SEU cross sections; semiconductor devices; upset rate; Energy exchange; Energy measurement; Extraterrestrial measurements; Instruction sets; Low earth orbit satellites; Nuclear measurements; Particle beams; Protons; Semiconductor devices; Volume measurement;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213547
