Test of CZT detectors with different pixel pitches and thicknesses

Author

Li, Qiang ; Garson, Alfred III ; Jung, Ira ; Groza, Michael ; Dowkontt, Paul ; Bose, Richard ; Simburger, Garry ; Burger, Arnold ; Krawczynski, Henric

Author_Institution

Washington Univ. in St. Louis, St. Louis

Volume

3

fYear

2007

fDate

Oct. 26 2007-Nov. 3 2007

Firstpage

2381

Lastpage

2385

Abstract

The modified horizontal Bridgman (MHB) process produces cadmium zinc telluride (CZT) crystals with high yield and excellent homogeneity. Various groups, including our own, previously reported on the test of 2times2times0.5 cm³ MHB CZT detectors grown by the company Orbotech and read out with 8times8 pixels. In this contribution, we describe the optimization of the photolithographic process used for contacting the CZT detector with pixel contacts. The optimized process gives a high yield of good pixels down to pixel diameters/pitches of 50 microns. Furthermore, we discuss the performance of 0.5 cm and 0.75 cm thick detectors contacted with 64 and 225 pixel read out with the RENA-3 ASICs from the company NOVA R&D.

Keywords

application specific integrated circuits; nuclear electronics; photolithography; position sensitive particle detectors; readout electronics; semiconductor counters; CZT detectors; NOVA R&D company; Orbotech company; RENA-3 ASIC; cadmium zinc telluride crystals; modified horizontal Bridgman process; photolithographic process; pixel pitches; read out electronics; size 0.5 cm; size 0.75 cm; Cadmium compounds; Gamma ray bursts; Large-scale systems; Neutrino sources; Physics; Radioactive decay; Testing; X-ray detection; X-ray detectors; Zinc compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE

Conference_Location

Honolulu, HI

ISSN

1095-7863

Print_ISBN

978-1-4244-0922-8

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2007.4436623

Filename

4436623