DocumentCode :
2838670
Title :
Maximum lateral flight deviations from the ILS centerline
Author :
Levy, Benjamin S.
Author_Institution :
Sensis Corp., DeWitt, NY, USA
Volume :
2
fYear :
2005
fDate :
30 Oct.-3 Nov. 2005
Abstract :
A procedure is presented for developing spatial confidence intervals about the instrument landing system (i.e., ILS) centerline to determine the likelihood of catastrophic blunder for simultaneous arrivals to closely-spaced parallel runways. The spatial confidence interval is based on the statistics of the maximum lateral deviations (i.e., max(δL)) of arriving aircraft position data with respect to the ILS centerline. The procedure was applied at Memphis International Airport (MEM) and Lambert-St. Louis Airport (STL).
Keywords :
gamma distribution; instrument landing systems; Lambert-St. Louis Airport; Memphis International Airport; aircraft position data; catastrophic blunder likelihood; gamma probability distribution function; instrument landing system centerline; maximum lateral flight deviations; spatial confidence intervals; Aircraft; Airports; Instruments; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Avionics Systems Conference, 2005. DASC 2005. The 24th
Print_ISBN :
0-7803-9307-4
Type :
conf
DOI :
10.1109/DASC.2005.1563445
Filename :
1563445
Link To Document :
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